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SN74BCT8373ADWRE4

SN74BCT8373ADWRE4
Mfr. #:
SN74BCT8373ADWRE4
Descripción:
IC SCAN TEST DEVICE LATCH 24SOIC
Ciclo vital:
Nuevo de este fabricante.
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SN74BCT8373ADWRE4 Ficha de datos
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SN74BCT8373ADWRE4 más información SN74BCT8373ADWRE4 Product Details
Atributo del producto
Valor de atributo
Tags
SN74BCT8373ADWR, SN74BCT8373AD, SN74BCT8373A, SN74BCT8373, SN74BCT83, SN74BCT8, SN74B, SN74, SN7
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We provide 90-360 days warranty.

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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE LATCH 24SOIC
***ark
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-SOIC; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
***as Instruments
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches. In the test mode, the normal operation of the SCOPETM octal latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8373A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8373A is characterized for operation from 0°C to 70°C.
Parte # Descripción Valores Precio
SN74BCT8373ADWRE4
DISTI # SN74BCT8373ADWRE4-ND		IC SCAN TEST DEVICE LATCH 24SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74BCT8373ADWRE4
    DISTI # 595-SN74BCT8373ADWRE    		Specialty Function Logic Fixed LDO Volt Reg
    RoHS: Compliant    		0
      Imagen Parte # Descripción
      SN74BCT8373ADWRE4

      Mfr.#: SN74BCT8373ADWRE4

      OMO.#: OMO-SN74BCT8373ADWRE4

      		 Specialty Function Logic Fixed LDO Volt Reg
      SN74BCT8244ANTG4

      Mfr.#: SN74BCT8244ANTG4

      OMO.#: OMO-SN74BCT8244ANTG4-TEXAS-INSTRUMENTS

      		 IC SCAN TEST DEVICE BUFF 24-DIP
      SN74BCT8245ANT

      Mfr.#: SN74BCT8245ANT

      OMO.#: OMO-SN74BCT8245ANT-TEXAS-INSTRUMENTS

      		 IC SCAN TEST DEVICE TXRX 24-DIP
      SN74BCT8373ADWRG4

      Mfr.#: SN74BCT8373ADWRG4

      OMO.#: OMO-SN74BCT8373ADWRG4-TEXAS-INSTRUMENTS

      		 IC SCAN TEST DEVICE 24SOIC
      SN74BCT8373DWR

      Mfr.#: SN74BCT8373DWR

      OMO.#: OMO-SN74BCT8373DWR-1190

      		 Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24
      SN74BCT8373NT

      Mfr.#: SN74BCT8373NT

      OMO.#: OMO-SN74BCT8373NT-1190

      		 Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24
      SN74BCT8373ADW

      Mfr.#: SN74BCT8373ADW

      OMO.#: OMO-SN74BCT8373ADW-TEXAS-INSTRUMENTS

      		 Specialty Function Logic Device w/Octal D-Type Latches
      SN74BCT8244ADWE4

      Mfr.#: SN74BCT8244ADWE4

      OMO.#: OMO-SN74BCT8244ADWE4-TEXAS-INSTRUMENTS

      		 Specialty Function Logic Device w/Octal Buffers
      SN74BCT8244ANT

      Mfr.#: SN74BCT8244ANT

      OMO.#: OMO-SN74BCT8244ANT-TEXAS-INSTRUMENTS

      		 Specialty Function Logic Device w/Octal Buffers
      SN74BCT8240ADW

      Mfr.#: SN74BCT8240ADW

      OMO.#: OMO-SN74BCT8240ADW-TEXAS-INSTRUMENTS

      		 Specialty Function Logic Device w/Octal Inverting Buffers
      Disponibilidad
      Valores:
      Available
      En orden:
      2000
      Ingrese la cantidad:
      El precio actual de SN74BCT8373ADWRE4 es solo de referencia, si desea obtener el mejor precio, envíe una consulta o envíe un correo electrónico directo a nuestro equipo de ventas [email protected]
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      Debido a la escasez de semiconductores a partir de 2021, el precio inferior es el precio normal antes de 2021. Envíe una consulta para confirmar.
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