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SN74ABT8245DWR

SN74ABT8245DWR
Mfr. #:
SN74ABT8245DWR
Descripción:
Specialty Function Logic Scan Test Device
Ciclo vital:
Nuevo de este fabricante.
Ficha de datos:
SN74ABT8245DWR Ficha de datos
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Más información:
SN74ABT8245DWR más información SN74ABT8245DWR Product Details
Atributo del producto
Valor de atributo
Fabricante:
Instrumentos Texas
Categoria de producto:
Lógica de funciones especiales
RoHS:
Y
Serie:
SN74ABT8245
Voltaje de suministro operativo:
4.5 V to 5.5 V
Temperatura mínima de funcionamiento:
- 40 C
Temperatura máxima de funcionamiento:
+ 85 C
Paquete / Caja:
SOIC-24
Embalaje:
Carrete
Función:
Dispositivo de prueba de escaneo con transceptor de bus
Numero de circuitos:
1
Rango de temperatura de funcionamiento:
- 40 C to + 85 C
Marca:
Instrumentos Texas
Estilo de montaje:
SMD / SMT
Tipo de producto:
Lógica de funciones especiales
Tiempo de retardo de propagación:
4.3 ns
Cantidad de paquete de fábrica:
2000
Subcategoría:
Circuitos integrados lógicos
Nombre comercial:
ALCANCE
Unidad de peso:
0.022025 oz
Tags
SN74ABT824, SN74ABT82, SN74ABT8, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    E**m
    E**m
    LK

    Thank you seller, all plates are working.

    2019-03-25
    A***v
    A***v
    RU

    The order did not reach. 90 days.

    2019-04-02
***as Instruments
Scan Test Devices With Octal Bus Transceivers 24-SOIC -40 to 85
***ical
Scan Test Device -40C to 85C 24-Pin SOIC T/R
***p One Stop Global
Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R
***i-Key
IC SCAN TEST DEV W/OBT 24-SOIC
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-SOIC; No. of Pins:24; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***OMO Electronic
The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INS
In the normal mode, these devices are functionally equivalent to the 'F245 and 'ABT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers.
***AS INSTRUMEN
Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The output-enable () input can be used to disable the device so that the buses are effectively isolated.
***ASI
 
***AS INSTRU
In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.
***ASI
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***TEXAS
The SN54ABT8245 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8245 is characterized for operation from -40°C to 85°C.
***as Instruments (TI)
 
***as Instr.
 
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
Parte # Descripción Valores Precio
SN74ABT8245DWR
DISTI # 29459122		Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R
RoHS: Compliant		2000
  • 2000:$3.4081
SN74ABT8245DWR
DISTI # 296-14679-1-ND		IC SCAN TEST DEV W/OBT 24-SOIC
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)		260In Stock
  • 1000:$3.7432
  • 500:$4.2978
  • 100:$4.9355
  • 10:$5.9610
  • 1:$6.6000
SN74ABT8245DWR
DISTI # 296-14679-6-ND		IC SCAN TEST DEV W/OBT 24-SOIC
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®		260In Stock
  • 1000:$3.7432
  • 500:$4.2978
  • 100:$4.9355
  • 10:$5.9610
  • 1:$6.6000
SN74ABT8245DWR
DISTI # 296-14679-2-ND		IC SCAN TEST DEV W/OBT 24-SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Temporarily Out of Stock
  • 2000:$3.4996
SN74ABT8245DWR
DISTI # SN74ABT8245DWR		Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R (Alt: SN74ABT8245DWR)
RoHS: Compliant
Min Qty: 2000
Container: Tape and Reel		Europe - 0
  • 2000:€4.4900
  • 4000:€3.8900
  • 8000:€3.4900
  • 12000:€3.3900
  • 20000:€3.1900
SN74ABT8245DWR
DISTI # SN74ABT8245DWR		Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R - Tape and Reel (Alt: SN74ABT8245DWR)
RoHS: Compliant
Min Qty: 2000
Container: Reel		Americas - 0
  • 2000:$3.8900
  • 4000:$3.6900
  • 8000:$3.4900
  • 12000:$3.3900
  • 20000:$3.2900
SN74ABT8245DWRScan Test Devices With Octal Bus Transceivers3818
  • 1000:$3.0600
  • 750:$3.1200
  • 500:$3.6100
  • 250:$4.1500
  • 100:$4.4400
  • 25:$4.9500
  • 10:$5.3000
  • 1:$5.9000
SN74ABT8245DW
DISTI # 595-SN74ABT8245DW		Specialty Function Logic Scan Test Device
RoHS: Compliant		118
  • 1:$7.6900
  • 10:$6.9500
  • 25:$6.4300
  • 100:$5.7500
  • 250:$5.4600
  • 500:$5.0100
  • 1000:$4.3700
SN74ABT8245DWG4
DISTI # 595-SN74ABT8245DWG4		Specialty Function Logic Scan Test Devices
RoHS: Compliant		0
  • 100:$5.7500
  • 250:$5.4600
  • 500:$5.0100
  • 1000:$4.3700
SN74ABT8245DWR
DISTI # 595-SN74ABT8245DWR		Specialty Function Logic Scan Test Device
RoHS: Compliant		0
  • 2000:$3.5000
SN74ABT8245DWRG4
DISTI # 595-SN74ABT8245DWRG4		Specialty Function Logic Scan Test Devices
RoHS: Compliant		0
    SN74ABT8245DWRE4
    DISTI # 595-SN74ABT8245DWRE4    		Specialty Function Logic Scan Test Device w/Octal Bus Trnscvr
    RoHS: Compliant    		0
      SN74ABT8245DWRBus Transceiver, Single, 8 Bit, 24 Pin, Plastic, SOP1640
      • 1287:$2.2260
      • 787:$2.3320
      • 1:$6.3600
      SN74ABT8245DWR 519
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        SN74ABT2244ADBR

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        OMO.#: OMO-SN74ABTH32245PZ-TEXAS-INSTRUMENTS

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        Disponibilidad
        Valores:
        Available
        En orden:
        5500
        Ingrese la cantidad:
        El precio actual de SN74ABT8245DWR es solo de referencia, si desea obtener el mejor precio, envíe una consulta o envíe un correo electrónico directo a nuestro equipo de ventas [email protected]
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