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SN74ABT8652DLR

SN74ABT8652DLR
Mfr. #:
SN74ABT8652DLR
Descripción:
Specialty Function Logic Device w/Octal Bus Trnscvr & Register
Ciclo vital:
Nuevo de este fabricante.
Ficha de datos:
SN74ABT8652DLR Ficha de datos
Entrega:
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ECAD Model:
Más información:
SN74ABT8652DLR más información SN74ABT8652DLR Product Details
Atributo del producto
Valor de atributo
Fabricante:
Instrumentos Texas
Categoria de producto:
Lógica de funciones especiales
RoHS:
Y
Producto:
Boundry Scan JTAG Logic
Serie:
74AB
Voltaje de suministro operativo:
4.5 V to 5.5 V
Paquete / Caja:
SSOP-28
Embalaje:
Carrete
Marca:
Instrumentos Texas
Estilo de montaje:
SMD / SMT
Tipo de producto:
Lógica de funciones especiales
Cantidad de paquete de fábrica:
1
Subcategoría:
Circuitos integrados lógicos
Unidad de peso:
0.025045 oz
Tags
SN74ABT8652DL, SN74ABT865, SN74ABT86, SN74ABT8, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE 28-SSOP
***as Instruments
The 'ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F652 and 'ABT652 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers and registers. Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and inputs. Since the input is active low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 shows the four fundamental bus-management functions that can be performed with the 'ABT8652. In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8652 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8652 is characterized for operation from -40°C to 85°C.
Parte # Descripción Valores Precio
SN74ABT8652DLR
DISTI # SN74ABT8652DLR-ND		IC SCAN TEST DEVICE 28-SSOP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74ABT8652DLRG4
    DISTI # SN74ABT8652DLRG4-ND    		IC SCAN TEST DEVICE 28-SSOP
    RoHS: Compliant
    Min Qty: 1000
    Container: Tape & Reel (TR)    		Limited Supply - Call
      SN74ABT8652DLR
      DISTI # 595-SN74ABT8652DLR      		Specialty Function Logic Device w/Octal Bus Trnscvr & Register
      RoHS: Compliant      		0
        SN74ABT8652DLRG4
        DISTI # 595-SN74ABT8652DLRG4        		Specialty Function Logic Device w/Octal Bus Trnscvr & Register
        RoHS: Compliant        		0
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          Disponibilidad
          Valores:
          Available
          En orden:
          3000
          Ingrese la cantidad:
          El precio actual de SN74ABT8652DLR es solo de referencia, si desea obtener el mejor precio, envíe una consulta o envíe un correo electrónico directo a nuestro equipo de ventas [email protected]
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