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SN74ABT18504PMRG4

SN74ABT18504PMRG4
Mfr. #:
SN74ABT18504PMRG4
Descripción:
Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
Ciclo vital:
Nuevo de este fabricante.
Ficha de datos:
SN74ABT18504PMRG4 Ficha de datos
Entrega:
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Más información:
SN74ABT18504PMRG4 más información SN74ABT18504PMRG4 Product Details
Atributo del producto
Valor de atributo
Fabricante:
Instrumentos Texas
Categoria de producto:
Lógica de funciones especiales
RoHS:
Y
Producto:
Boundry Scan JTAG Logic
Voltaje de suministro operativo:
+ 4.5 Vto+ 5.5 V
Paquete / Caja:
LQFP-64
Embalaje:
Carrete
Función:
Transceptores con registros / UBT
Corriente de salida:
- 32 mA / + 64 mA
Marca:
Instrumentos Texas
Estilo de montaje:
SMD / SMT
Tipo de producto:
Lógica de funciones especiales
Cantidad de paquete de fábrica:
1
Subcategoría:
Circuitos integrados lógicos
Unidad de peso:
0.012088 oz
Tags
SN74ABT18504, SN74ABT185, SN74ABT18, SN74ABT1, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE 20BIT 64LQFP
***as Instruments
The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers. Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the , LEBA, , and CLKBA inputs. In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions such as parallel signature analysis on data inputs and pseudo-random pattern generation from data outputs. All testing and scan operations are synchronized to the TAP interface. Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count addressing scheme is useful. The SN54ABT18504 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT18504 is characterized for operation from -40°C to 85°C.
Parte # Descripción Valores Precio
SN74ABT18504PMRG4
DISTI # SN74ABT18504PMRG4-ND		IC SCAN TEST DEVICE 20BIT 64LQFP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74ABT18504PMRG4
    DISTI # 595-SN74ABT18504PG4    		Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
    RoHS: Compliant    		0
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      Disponibilidad
      Valores:
      Available
      En orden:
      2000
      Ingrese la cantidad:
      El precio actual de SN74ABT18504PMRG4 es solo de referencia, si desea obtener el mejor precio, envíe una consulta o envíe un correo electrónico directo a nuestro equipo de ventas [email protected]
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