EPCDESIGNTOOL Gallium Nitride (GaN) FET Design Too

By EPC 77

EPCDESIGNTOOL Gallium Nitride (GaN) FET Design Too

EPC's EPCDESIGNTOOL devices are ideal for daisy-chain and electromigration testing. A variety of die sizes are available. Electromigration test devices have internal metal layers shorted for electromigration reliability testing.

Daisy-chain test devices are suitable for a wide variety of process-related testing including life cycle testing, drop testing, thermal testing, and optimizing the assembly process.

Features
  • Electromigration test devices:
    • Internal metal layers shorted for electromigration reliability testing
  • Daisy-chain test devices:
    • Suitable for a wide variety of process-related testing including life cycle testing, drop testing, thermal testing, and optimizing the assembly process
    • Daisy-chained packages are wired to provide a continuous path through the package for easy testing

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